Job Description

Location: 1 North Coast Drive, Singapore

Project Title

NAND Advanced CMOS Metal‑Short Reliability Study and Process Improvement Exploration

Project Description

This internship provides a structured learning opportunity within the Process Integration team, focusing on advanced NAND CMOS metallisation concepts and reliability study methodologies. The intern will be introduced to reliability failure mechanisms and evaluation approaches, with exposure to data analytics and AI/ML platforms used to study failure trends and enhance reliability understanding.

Under guidance from the team, the intern will participate in activities involving Micron‑customised analytics tools and dashboards, and observe how cross‑functional teams apply data insights to explore and propose potential process improvement ideas.

Project Scope
  • Fundamentals of CMOS metallisation processes and process interactions
  • Overview of process evaluation changes an...

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